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Applied Optics

Applied Optics


  • Vol. 37, Iss. 4 — Feb. 1, 1998
  • pp: 729–732

Spectral reflectance of silicon photodiodes

Atte Haapalinna, Petri Kärhä, and Erkki Ikonen  »View Author Affiliations

Applied Optics, Vol. 37, Issue 4, pp. 729-732 (1998)

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A precision spectrometer was used to measure the spectral reflectance of a silicon photodiode over the wavelength range from 250 to 850 nm. The results were compared with the corresponding values predicted by a model based on thin-film Fresnel formulas and the known refractive indices of silicon and silicon dioxide. The good agreement at the level of 2 × 10-3 in the visible wavelength range verifies that the reflection model can be used for accurate extrapolation of the spectral reflectance and responsivity of silicon photodiode devices. In addition, characterization of the photodiode reflectance in the ultraviolet region improves the accuracy of the spectral irradiance measurements when filter radiometers based on trap detectors are used.

© 1998 Optical Society of America

OCIS Codes
(040.6040) Detectors : Silicon
(040.7190) Detectors : Ultraviolet
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(230.5170) Optical devices : Photodiodes

Original Manuscript: July 8, 1997
Revised Manuscript: October 7, 1997
Published: February 1, 1998

Atte Haapalinna, Petri Kärhä, and Erkki Ikonen, "Spectral reflectance of silicon photodiodes," Appl. Opt. 37, 729-732 (1998)

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  1. E. F. Zalewski, C. R. Duda, “Silicon photodiode device with 100% external quantum efficiency,” Appl. Opt. 22, 2867–2873 (1983). [CrossRef] [PubMed]
  2. N. P. Fox, “Trap detectors and their properties,” Metrologia 28, 197–202 (1991). [CrossRef]
  3. D. H. Nettleton, T. R. Prior, T. H. Ward, “Improved spectral responsivity scales at the NPL, 400 nm to 20 μm,” Metrologia 30, 425–432 (1993). [CrossRef]
  4. T. R. Gentile, J. M. Houston, C. L. Cromer, “Realization of a scale of absolute spectral response using the National Institute of Standards and Technology high-accuracy cryogenic radiometer,” Appl. Opt. 35, 4392–4403 (1996). [CrossRef] [PubMed]
  5. P. Kärhä, A. Lassila, H. Ludvigsen, F. Manoochehri, H. Fagerlund, E. Ikonen, “Optical power and transmittance measurements and their use in detector-based realization of the luminous intensity scale,” Opt. Eng. 34, 2611–2618 (1995). [CrossRef]
  6. C. L. Cromer, G. Eppeldauer, J. E. Hardis, T. C. Larason, Y. Ohno, A. C. Parr, “The NIST detector-based luminous intensity scale,” J. Res. Natl. Inst. Stand. Technol. 101, 109–132 (1996). [CrossRef]
  7. B. C. Johnson, C. L. Cromer, R. D. Saunders, G. Eppeldauer, J. Fowler, V. I. Sapritsky, G. Dezsi, “A method for realizing spectral irradiance based on an absolute cryogenic radiometer,” Metrologia 30, 309–315 (1993). [CrossRef]
  8. P. Kärhä, P. Toivanen, F. Manoochehri, E. Ikonen, “Development of a detector-based absolute spectral irradiance scale in the 380–900 nm spectral range,” Appl. Opt. 36, 8909–8918 (1997). [CrossRef]
  9. M. Born, E. Wolf, Principles of Optics, 3rd ed. (Pergamon, Oxford, 1965), pp. 40, 632–633.
  10. I. H. Malitson, “Interspecimen comparison of the refractive index of fused silica,” J. Opt. Soc. Am. 55, 1205–1209 (1965). [CrossRef]
  11. G. E. Jellison, “Optical functions of silicon determined by two-channel polarization modulation ellipsometry,” Opt. Mater. 1, 41–47 (1992). [CrossRef]
  12. P. Kärhä, R. Visuri, K. Leszcynski, F. Manoochehri, K. Jokela, E. Ikonen, “Detector-based calibration method for high-accuracy solar UV measurements,” Photochem. Photobiol. 64, 340–343 (1996). [CrossRef]
  13. J. J. Hsia, V. R. Weidner, “NBS specular reflectometer–spectrophotometer,” Appl. Opt. 19, 1268–1273 (1994).
  14. F. Manoochehri, E. Ikonen, “High-accuracy spectrometer for measurement of regular spectral transmittance,” Appl. Opt. 34, 3686–3692 (1995). [CrossRef] [PubMed]
  15. F. Manoochehri, A. Haapalinna, E. Ikonen, “High-accuracy measurement of regular spectral transmittance and reflectance in UV–visible–NIR,” in Proceedings of the XIV IMEKO World Congress, Vol. 2, J. Halttunen, ed. (Finnish Society of Automation, Helsinki, Finland, 1997), pp. 108–113.

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