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Applied Optics

Applied Optics


  • Vol. 37, Iss. 7 — Mar. 1, 1998
  • pp: 1135–1139

Reference-beam system for measuring relative small-surface local irregularities of a reflective object

Moisés Cywiak and Cristina Solano  »View Author Affiliations

Applied Optics, Vol. 37, Issue 7, pp. 1135-1139 (1998)

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We present an optical technique for measuring irregularities on a small local surface (≈λ/100). This new technique uses a narrow laser beam as a local probe. The probe beam interferes with a reference beam. We use a 90° phase delay on the reference beam to increase the sensitivity. We show that if the test surface vibrates laterally, the collected power of the interferogram encodes as amplitude modulations, on a sinusoidal temporal carrier, the local surface irregularities.

© 1998 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(310.0310) Thin films : Thin films

Original Manuscript: November 18, 1996
Revised Manuscript: October 8, 1997
Published: March 1, 1998

Moisés Cywiak and Cristina Solano, "Reference-beam system for measuring relative small-surface local irregularities of a reflective object," Appl. Opt. 37, 1135-1139 (1998)

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