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Applied Optics

Applied Optics


  • Vol. 37, Iss. 7 — Mar. 1, 1998
  • pp: 1180–1193

Interfacial roughness and related scatter in ultraviolet optical coatings: a systematic experimental approach

Stefan Jakobs, Angela Duparré, and Horst Truckenbrodt  »View Author Affiliations

Applied Optics, Vol. 37, Issue 7, pp. 1180-1193 (1998)

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For a variety of UV optical coatings, surface roughness was measured by use of an atomic-force microscope (AFM) to study its dependence on the film material and thickness, coating design, and deposition process. After analyzing the corresponding power spectral density functions, we propose a simple classification model for coatings according to the contributions of substrate roughness and intrinsic film roughness to the scattering. Results of scattering measurements on different types of coatings are presented and are found to be in good agreement with predictions based on the AFM data. Consequences for a scatter reduction strategy are discussed.

© 1998 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(240.5770) Optics at surfaces : Roughness
(290.0290) Scattering : Scattering
(310.0310) Thin films : Thin films

Original Manuscript: June 2, 1997
Revised Manuscript: October 2, 1997
Published: March 1, 1998

Stefan Jakobs, Angela Duparré, and Horst Truckenbrodt, "Interfacial roughness and related scatter in ultraviolet optical coatings: a systematic experimental approach," Appl. Opt. 37, 1180-1193 (1998)

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