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Applied Optics

Applied Optics


  • Vol. 37, Iss. 8 — Mar. 10, 1998
  • pp: 1370–1376

Two-dimensional regression for interferometric phase extraction

Enxi Yu and Soyoung Stephen Cha  »View Author Affiliations

Applied Optics, Vol. 37, Issue 8, pp. 1370-1376 (1998)

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An approach based on two-dimensional iterative nonlinear regression for retrieving phase information from single-frame interferograms was formulated and tested for fluid- and heat-flow measurements. Even though an initial crude phase assignment—i.e., fringe-order numbers at limited data points—is needed, the approach does not require complete phase unwrapping as in conventional techniques. Testing of computer-simulated and real interferometric data shows stable convergence and accurate phase extraction. The method works well under a high noise level, including broken fringes or contaminated regions, with a good noise-cleansing capacity. It provides accuracy at image- or opaque-object boundaries and directly offers spatial-gradient values. A weakness, however, can be intensive computation in the iterative estimation. The method is a good candidate for single-frame interferogram reduction.

© 1998 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(280.2490) Remote sensing and sensors : Flow diagnostics

Original Manuscript: July 3, 1997
Revised Manuscript: October 27, 1997
Published: March 10, 1998

Enxi Yu and Soyoung Stephen Cha, "Two-dimensional regression for interferometric phase extraction," Appl. Opt. 37, 1370-1376 (1998)

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