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Applied Optics

Applied Optics


  • Vol. 38, Iss. 1 — Jan. 1, 1999
  • pp: 29–36

Characterization of a charge-coupled-device detector in the 1100–0.14-nm (1-eV to 9-keV) spectral region

Luca Poletto, Alessio Boscolo, and Giuseppe Tondello  »View Author Affiliations

Applied Optics, Vol. 38, Issue 1, pp. 29-36 (1999)

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The performances of a CCD detector have been evaluated in a wide spectral region, which ranges from the near IR to the soft x ray. Four different experimental setups have been used: a Czerny–Turner monochromator for the 1100–250-nm region, a normal-incidence Johnson–Onaka monochromator for the 250–30-nm region, a grazing-incidence Rowland monochromator for the 30–0.27-nm region, and a test facility with broadband filters for the 0.27–0.14-nm region. The CCD is thinned and backilluminated, with a 512 × 512 format and 24 µm × 24 µm pixels. The quantum efficiency was measured in the 1100–0.14-nm (1-eV to 9-keV) region, and the uniformity of response was in the 1100–58-nm (1–21-eV) region. Contamination effects in the vacuum UV range are also discussed.

© 1999 Optical Society of America

OCIS Codes
(040.1520) Detectors : CCD, charge-coupled device
(040.7190) Detectors : Ultraviolet
(120.4140) Instrumentation, measurement, and metrology : Monochromators

Original Manuscript: June 22, 1998
Revised Manuscript: June 9, 1998
Published: January 1, 1999

Luca Poletto, Alessio Boscolo, and Giuseppe Tondello, "Characterization of a charge-coupled-device detector in the 1100–0.14-nm (1-eV to 9-keV) spectral region," Appl. Opt. 38, 29-36 (1999)

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