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Applied Optics

Applied Optics


  • Vol. 38, Iss. 1 — Jan. 1, 1999
  • pp: 96–100

Multiwavelength shearography for quantitative measurements of two-dimensional strain distributions

Ralf Kästle, Erwin Hack, and Urs Sennhauser  »View Author Affiliations

Applied Optics, Vol. 38, Issue 1, pp. 96-100 (1999)

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We report on the development of a multiwavelength speckle pattern shearing interferometer for the determination of two-dimensional strain distributions. This system is based on simultaneous illumination of the object with three diode lasers that emit at different wavelengths between 800 and 850 nm. Wavelength separation and image acquisition were performed with a special optical arrangement, including narrow-bandpass filters and three black-and-white cameras. The shearographic camera with a variable shearing element, in combination with the appropriate illumination geometry, permitted us to isolate all six displacement derivatives from phase-stepped fringe patterns. The optical system and the measurement procedure were validated with two different experiments. First, the shearographic sensor head was used for the determination of in-plane displacements, and, second, in-plane strain distributions of an aluminum block caused by temperature expansion were measured.

© 1999 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

Original Manuscript: June 22, 1998
Revised Manuscript: September 16, 1998
Published: January 1, 1999

Ralf Kästle, Erwin Hack, and Urs Sennhauser, "Multiwavelength shearography for quantitative measurements of two-dimensional strain distributions," Appl. Opt. 38, 96-100 (1999)

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