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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 1 — Jan. 1, 1999
  • pp: 96–100

Multiwavelength shearography for quantitative measurements of two-dimensional strain distributions

Ralf Kästle, Erwin Hack, and Urs Sennhauser  »View Author Affiliations


Applied Optics, Vol. 38, Issue 1, pp. 96-100 (1999)
http://dx.doi.org/10.1364/AO.38.000096


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Abstract

We report on the development of a multiwavelength speckle pattern shearing interferometer for the determination of two-dimensional strain distributions. This system is based on simultaneous illumination of the object with three diode lasers that emit at different wavelengths between 800 and 850 nm. Wavelength separation and image acquisition were performed with a special optical arrangement, including narrow-bandpass filters and three black-and-white cameras. The shearographic camera with a variable shearing element, in combination with the appropriate illumination geometry, permitted us to isolate all six displacement derivatives from phase-stepped fringe patterns. The optical system and the measurement procedure were validated with two different experiments. First, the shearographic sensor head was used for the determination of in-plane displacements, and, second, in-plane strain distributions of an aluminum block caused by temperature expansion were measured.

© 1999 Optical Society of America

OCIS Codes
(050.5080) Diffraction and gratings : Phase shift
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

History
Original Manuscript: June 22, 1998
Revised Manuscript: September 16, 1998
Published: January 1, 1999

Citation
Ralf Kästle, Erwin Hack, and Urs Sennhauser, "Multiwavelength shearography for quantitative measurements of two-dimensional strain distributions," Appl. Opt. 38, 96-100 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-1-96


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References

  1. Y. Y. Hung, “Shearography: a new optical method for strain measurement and nondestructive testing,” Opt. Eng. 21, 391–395 (1982). [CrossRef]
  2. A. Ettemeyer, “Shearografie—ein optisches Verfahren zur zerstörungsfreien Werkstoff prüfung,” Tech. Messen 58, 247–252 (1991).
  3. Y. Y. Hung, “Shearography for nondestructive evaluation of composite structures,” Opt. Lasers Eng. 24, 161–182 (1996). [CrossRef]
  4. L. X. Yang, W. Steinchen, M. Schuth, G. Kupfer, “Precision measurement and nondestructive testing by means of digital phase shifting speckle pattern and speckle pattern shearing interferometry,” Measurement 16, 149–160 (1995). [CrossRef]
  5. Y. Y. Hung, J. Q. Wang, “Dual-beam phase shift shearography for measurements of in-plane strains,” Opt. Lasers Eng. 24, 403–413 (1996). [CrossRef]
  6. H. A. Aebischer, S. Waldner, “Strain distributions made visible with image-shearing speckle pattern interferometry,” Opt. Lasers Eng. 26, 407–420 (1997). [CrossRef]
  7. W. Steinchen, L. X. Yang, M. Schuth, “TV shearography for measuring 3D strains,” Strain 32, 49–57 (1996). [CrossRef]
  8. K. Patorski, A. Olszak, “Digital in-plane electronic speckle pattern shearing interferometry,” Opt. Eng. 36, 2010–2015 (1997). [CrossRef]

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