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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 10 — Apr. 1, 1999
  • pp: 2053–2058

Simple expressions for transmission and reflection matrix elements of a biaxial thin layer at normal incidence

E. Cojocaru  »View Author Affiliations


Applied Optics, Vol. 38, Issue 10, pp. 2053-2058 (1999)
http://dx.doi.org/10.1364/AO.38.002053


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Abstract

The extended Jones matrix method is applied for determination of the transmission and reflection matrices for a normally incident plane wave upon an homogeneous and lossless biaxial thin layer. The elements of these matrices are expressed by simple analytical relations. By using these relations one can express analytically the polarization-dependent optical parameters to be determined by generalized ellipsometry.

© 1999 Optical Society of America

OCIS Codes
(080.2730) Geometric optics : Matrix methods in paraxial optics
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.7000) Instrumentation, measurement, and metrology : Transmission
(190.5330) Nonlinear optics : Photorefractive optics
(260.1180) Physical optics : Crystal optics
(260.5430) Physical optics : Polarization

History
Original Manuscript: August 3, 1998
Revised Manuscript: December 1, 1998
Published: April 1, 1999

Citation
E. Cojocaru, "Simple expressions for transmission and reflection matrix elements of a biaxial thin layer at normal incidence," Appl. Opt. 38, 2053-2058 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-10-2053

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