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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 11 — Apr. 10, 1999
  • pp: 2196–2203

Electronic Channel Fringe Holography for Depth and Delay Measurements

Ignacio Iglesias, Hsuan S. Chen, Kurt D. Mills, David S. Dilworth, and Emmett N. Leith  »View Author Affiliations


Applied Optics, Vol. 38, Issue 11, pp. 2196-2203 (1999)
http://dx.doi.org/10.1364/AO.38.002196


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Abstract

Electronic spectral holography in the form developed by Shih [Ph.D. dissertation, University Microfilms, Ann Arbor, Mich. (1995)] is adapted to various applications, including optical coherence tomography in scattering media, contouring of surfaces, and optical fiber mode examination.

© 1999 Optical Society of America

OCIS Codes
(060.2270) Fiber optics and optical communications : Fiber characterization
(090.0090) Holography : Holography
(110.0110) Imaging systems : Imaging systems
(110.4500) Imaging systems : Optical coherence tomography
(110.6880) Imaging systems : Three-dimensional image acquisition
(110.6960) Imaging systems : Tomography

Citation
Ignacio Iglesias, Hsuan S. Chen, Kurt D. Mills, David S. Dilworth, and Emmett N. Leith, "Electronic Channel Fringe Holography for Depth and Delay Measurements," Appl. Opt. 38, 2196-2203 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-11-2196

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