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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 11 — Apr. 10, 1999
  • pp: 2256–2262

Complex phase tracing method for fringe pattern analysis

Janusz Kozłowski and Giovanni Serra  »View Author Affiliations


Applied Optics, Vol. 38, Issue 11, pp. 2256-2262 (1999)
http://dx.doi.org/10.1364/AO.38.002256


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Abstract

We present what we believe to be a novel complex phase tracing method for fringe pattern analysis related to the phase-locked loop idea. The image with deformed complex fringes is analyzed with lexicographic scansion that leads directly to the investigated phase without unwrapping. Robustness of the procedure is ensured by the delay mechanism in the process of calculating the reference value. A numerical model and examples of application of the presented method are given.

© 1999 Optical Society of America

OCIS Codes
(100.5070) Image processing : Phase retrieval
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry

History
Original Manuscript: January 7, 1998
Published: April 10, 1999

Citation
Janusz Kozłowski and Giovanni Serra, "Complex phase tracing method for fringe pattern analysis," Appl. Opt. 38, 2256-2262 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-11-2256

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