A simple method is presented for the measurement of in-plane rotation (angle and sign) of an object by use of the conventional in-plane sensitive electronic speckle pattern interferometry technique combined with the two-wavelength laser diode method. The advantage of this method is that it can be used to measure the angle of rotation in a simple way by determination of fringe tilt. The experimental setup is described, and results are presented.
© 1999 Optical Society of America
[Optical Society of America ]
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry
Abdel-Karim Nassim, Luc Joannes, and Alain Cornet, "In-Plane Rotation Analysis by Two-Wavelength Electronic Speckle Interferometry," Appl. Opt. 38, 2467-2470 (1999)