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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 12 — Apr. 20, 1999
  • pp: 2536–2539

Intracavity testing of KTiOPO4 crystals for second-harmonic generation at 532 nm

Hervé Albrecht, François Balembois, Dominique Lupinski, Patrick Georges, and Alain Brun  »View Author Affiliations


Applied Optics, Vol. 38, Issue 12, pp. 2536-2539 (1999)
http://dx.doi.org/10.1364/AO.38.002536


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Abstract

We have developed a diode-pumped Nd:YVO4 cw laser for testing KTiOPO4 crystals designed for intracavity second-harmonic generation at 532 nm. We demonstrate that this source is extremely sensitive to defects inside the crystal, inducing losses at 1064 nm and an index mismatch between fundamental and harmonic waves.

© 1999 Optical Society of America

OCIS Codes
(140.3480) Lasers and laser optics : Lasers, diode-pumped
(140.3580) Lasers and laser optics : Lasers, solid-state
(140.7300) Lasers and laser optics : Visible lasers
(190.2620) Nonlinear optics : Harmonic generation and mixing
(190.4400) Nonlinear optics : Nonlinear optics, materials

History
Original Manuscript: September 30, 1998
Revised Manuscript: January 4, 1999
Published: April 20, 1999

Citation
Hervé Albrecht, François Balembois, Dominique Lupinski, Patrick Georges, and Alain Brun, "Intracavity testing of KTiOPO4 crystals for second-harmonic generation at 532 nm," Appl. Opt. 38, 2536-2539 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-12-2536

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