Measurement of Absolute Displacement by a Double-Modulation Technique Based on a Michelson Interferometer
Applied Optics, Vol. 38, Issue 13, pp. 2843-2847 (1999)
http://dx.doi.org/10.1364/AO.38.002843
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Abstract
A novel method is presented for of measuring absolute displacement with a synthesized wavelength interferometer. The optical phase of the interferometer is simultaneously modulated with a frequency-modulated laser diode and optical path-length difference. The error signal originating from the intensity modulation of the source is eliminated by a signal processing circuit. In addition, a lock-in technique is used to demodulate the envelope of the interferometric signal. The displacement signal is derived by the self-mixing technique.
© 1999 Optical Society of America
[Optical Society of America ]
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
Citation
Lih-Wuu Chang, Pie-Yau Chien, and Ching-Ting Lee, "Measurement of Absolute Displacement by a Double-Modulation Technique Based on a Michelson Interferometer," Appl. Opt. 38, 2843-2847 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-13-2843
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