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Applied Optics

Applied Optics


  • Vol. 38, Iss. 13 — May. 1, 1999
  • pp: 2843–2847

Measurement of absolute displacement by a double-modulation technique based on a Michelson interferometer

Lih-Wuu Chang, Pie-Yau Chien, and Ching-Ting Lee  »View Author Affiliations

Applied Optics, Vol. 38, Issue 13, pp. 2843-2847 (1999)

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A novel method is presented for of measuring absolute displacement with a synthesized wavelength interferometer. The optical phase of the interferometer is simultaneously modulated with a frequency-modulated laser diode and optical path-length difference. The error signal originating from the intensity modulation of the source is eliminated by a signal processing circuit. In addition, a lock-in technique is used to demodulate the envelope of the interferometric signal. The displacement signal is derived by the self-mixing technique.

© 1999 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

Original Manuscript: August 24, 1998
Revised Manuscript: February 2, 1999
Published: May 1, 1999

Lih-Wuu Chang, Pie-Yau Chien, and Ching-Ting Lee, "Measurement of absolute displacement by a double-modulation technique based on a Michelson interferometer," Appl. Opt. 38, 2843-2847 (1999)

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