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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 16 — Jun. 1, 1999
  • pp: 3549–3555

Phase-step calibration for phase-stepped interferometry

Hedser van Brug  »View Author Affiliations


Applied Optics, Vol. 38, Issue 16, pp. 3549-3555 (1999)
http://dx.doi.org/10.1364/AO.38.003549


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Abstract

A novel method to set the proper phase steps, as used in phase-stepped interferometry, is presented. It is indicated how and when this method can be used. With only two images one can deduce the relative phase step between them by calculating the correlation between the two images. The error of the proposed method is shown to be smaller than 0.1%.

© 1999 Optical Society of America

OCIS Codes
(120.2650) Instrumentation, measurement, and metrology : Fringe analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry

History
Original Manuscript: December 18, 1998
Published: June 1, 1999

Citation
Hedser van Brug, "Phase-step calibration for phase-stepped interferometry," Appl. Opt. 38, 3549-3555 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-16-3549

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