Characteristics of Ray Traces at the Back of Biaxial Crystals at Normal Incidence
Applied Optics, Vol. 38, Issue 19, pp. 4004-4010 (1999)
http://dx.doi.org/10.1364/AO.38.004004
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Abstract
Ray vector traces that can be obtained at the back of a biaxial crystal through crystal rotation are calculated numerically by variation of one of the three Euler angles. Negative and positive lossless biaxial crystals are considered at normal incidence. Interesting features of these traces are evidenced by reference to the circular ring that forms at internal conical refraction.
© 1999 Optical Society of America
[Optical Society of America ]
OCIS Codes
(080.2730) Geometric optics : Matrix methods in paraxial optics
(120.5710) Instrumentation, measurement, and metrology : Refraction
(190.5330) Nonlinear optics : Photorefractive optics
(260.1180) Physical optics : Crystal optics
(260.1440) Physical optics : Birefringence
(260.5430) Physical optics : Polarization
Citation
E. Cojocaru, "Characteristics of Ray Traces at the Back of Biaxial Crystals at Normal Incidence," Appl. Opt. 38, 4004-4010 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-19-4004
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