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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 19 — Jul. 1, 1999
  • pp: 4047–4052

Complex refractive-index measurement based on Fresnel’s equations and the uses of heterodyne interferometry

Ming-Horng Chiu, Ju-Yi Lee, and Der-Chin Su  »View Author Affiliations


Applied Optics, Vol. 38, Issue 19, pp. 4047-4052 (1999)
http://dx.doi.org/10.1364/AO.38.004047


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Abstract

The phase difference between <i>s</i> and <i>p</i> polarization of the light reflected from a material is used for measuring the material’s complex refractive index. First, two phase differences that correspond to two different incidence angles are measured by heterodyne interferometry. Then these two phase differences are substituted into Fresnel’s equations, and a set of simultaneous equations is obtained. Finally, the equations are solved by use of a personal computer by a numerical analysis technique, and the complex refractive index of the material can be estimated.

© 1999 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5050) Instrumentation, measurement, and metrology : Phase measurement

Citation
Ming-Horng Chiu, Ju-Yi Lee, and Der-Chin Su, "Complex refractive-index measurement based on Fresnel’s equations and the uses of heterodyne interferometry," Appl. Opt. 38, 4047-4052 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-19-4047

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