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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 19 — Jul. 1, 1999
  • pp: 4058–4064

Refractive-index and thickness sensitivity in surface plasmon resonance spectroscopy

Takuo Akimoto, Satoshi Sasaki, Kazunori Ikebukuro, and Isao Karube  »View Author Affiliations


Applied Optics, Vol. 38, Issue 19, pp. 4058-4064 (1999)
http://dx.doi.org/10.1364/AO.38.004058


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Abstract

The sensitivities of surface plasmon resonance spectroscopy were examined at incident angles of 66–76 deg. The sensitivities were calculated for various refractive indices of liquid samples and for various thicknesses of deposited dielectric thin layers. Furthermore, the sensitivities were confirmed experimentally. The experimentally measured refractive indices and thicknesses were 1.3311–1.3463 and 0–89 nm, respectively. From these results it was demonstrated that the sensing system showed higher sensitivities with smaller incident angles. For example, the sensitivity for a refractive index at a 66° incident angle was seven times larger than that at 76°. It was also demonstrated that the resonant wavelength has a linear relation to the refractive index and the thickness at refractive indices and thicknesses of 1.33–1.345 and 0–100 nm, respectively, except for a 66° incident angle.

© 1999 Optical Society of America

OCIS Codes
(240.0310) Optics at surfaces : Thin films
(240.6680) Optics at surfaces : Surface plasmons
(300.6170) Spectroscopy : Spectra

History
Original Manuscript: November 18, 1998
Revised Manuscript: March 23, 1999
Published: July 1, 1999

Citation
Takuo Akimoto, Satoshi Sasaki, Kazunori Ikebukuro, and Isao Karube, "Refractive-index and thickness sensitivity in surface plasmon resonance spectroscopy," Appl. Opt. 38, 4058-4064 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-19-4058

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