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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 19 — Jul. 1, 1999
  • pp: 4074–4088

Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light

Franz Schäfers, Hans-Christoph Mertins, Andreas Gaupp, Wolfgang Gudat, Marcel Mertin, Ingo Packe, Frank Schmolla, Silvia Di Fonzo, Gérard Soullié, Werner Jark, Richard Walker, Xavier Le Cann, Ralf Nyholm, and Mikael Eriksson  »View Author Affiliations


Applied Optics, Vol. 38, Issue 19, pp. 4074-4088 (1999)
http://dx.doi.org/10.1364/AO.38.004074


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Abstract

The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the 2p edges of Sc, Ti, and Cr, resonantly enhanced phase retardation of the transmission polarizers of as much as 18° has been measured. With these newly developed optical elements the complete polarization analysis of soft-x-ray synchrotron radiation can be extended to the water-window range from 300 to 600 eV.

© 1999 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(120.5700) Instrumentation, measurement, and metrology : Reflection
(120.7000) Instrumentation, measurement, and metrology : Transmission
(230.5440) Optical devices : Polarization-selective devices
(340.6720) X-ray optics : Synchrotron radiation
(340.7480) X-ray optics : X-rays, soft x-rays, extreme ultraviolet (EUV)

History
Original Manuscript: January 4, 1999
Revised Manuscript: March 29, 1999
Published: July 1, 1999

Citation
Franz Schäfers, Hans-Christoph Mertins, Andreas Gaupp, Wolfgang Gudat, Marcel Mertin, Ingo Packe, Frank Schmolla, Silvia Di Fonzo, Gérard Soullié, Werner Jark, Richard Walker, Xavier Le Cann, Ralf Nyholm, and Mikael Eriksson, "Soft-x-ray polarimeter with multilayer optics: complete analysis of the polarization state of light," Appl. Opt. 38, 4074-4088 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-19-4074

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