OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 19 — Jul. 1, 1999
  • pp: 4125–4136

Optical characterization of a compact multilayer-mirror polarimeter in the extreme-ultraviolet range

Matthew Bailey, Hocine Merabet, and Reinhard F. Bruch  »View Author Affiliations


Applied Optics, Vol. 38, Issue 19, pp. 4125-4136 (1999)
http://dx.doi.org/10.1364/AO.38.004125


View Full Text Article

Enhanced HTML    Acrobat PDF (196 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A molybdenum–silicon (Mo/Si) multilayer-mirror (MLM) polarimeter has been constructed and used to analyze the extreme-ultraviolet (EUV) emission from excited HeI and HeII states following electron impact on He for wavelengths ranging from approximately 256 to 584 Å. A ratio of reflectivities for s- and p-polarized light, R s :R p ≈ 10, and a resolving power of λ/Δλ ≈ 6 at 304 Å were obtained. These characteristics and the use of a VYNS (a copolymer material composed of 90% vinyl chloride and 10% vinyl acetate) spectral filter were sufficient to allow a detailed polarization study of the first two members of the Lyman series of He+ at wavelengths of 304 Å (HeII 2p → 1s) and 256 Å (HeII 3p → 1s) for impact-electron energies ranging from threshold to 1500 eV. The MLM has also been used as a single flat-surface mirror polarimeter for the analysis of longer-wavelength radiation (517 to 584 Å) from the (1snp) 1P o → (1s2) 1S series of neutral He with R s /R p ≈ 3. Although MLM polarimeters were previously used for EUV measurements with bright photon sources such as those provided by synchrotron facilities, the results presented clearly demonstrate the feasibility of such devices with lower-intensity electron and ion impact sources. The compact design of the apparatus makes it suitable as a portable measurement and calibration device.

© 1999 Optical Society of America

OCIS Codes
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(230.4040) Optical devices : Mirrors
(230.4170) Optical devices : Multilayers
(230.5440) Optical devices : Polarization-selective devices
(300.2140) Spectroscopy : Emission

History
Original Manuscript: August 17, 1998
Revised Manuscript: February 16, 1999
Published: July 1, 1999

Citation
Matthew Bailey, Hocine Merabet, and Reinhard F. Bruch, "Optical characterization of a compact multilayer-mirror polarimeter in the extreme-ultraviolet range," Appl. Opt. 38, 4125-4136 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-19-4125

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited