OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 19 — Jul. 1, 1999
  • pp: 4172–4176

Anisotropic Protective Coating for Brewster angle Windows

Gregory Surdutovich, Ritta Vitlina, and Vitor Baranauskas  »View Author Affiliations


Applied Optics, Vol. 38, Issue 19, pp. 4172-4176 (1999)
http://dx.doi.org/10.1364/AO.38.004172


View Full Text Article

Acrobat PDF (103 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

We propose what we believe is a new type of dielectric anisotropic coating of arbitrary thickness that can protect Brewster angle windows without degrading their optical quality. Such a coating may be fabricated as a multilayer two-component structure. The parameters of the structure, i.e., the dielectric permittivities of the components and their concentrations, are calculated. For ZnSe windows two examples of anisotropic coatings are presented. The optical quality of the multilayer films does not depend on their precise thickness, which makes them less sensitive to surface damage.

© 1999 Optical Society of America

OCIS Codes
(240.0310) Optics at surfaces : Thin films
(310.1210) Thin films : Antireflection coatings
(310.1620) Thin films : Interference coatings

Citation
Gregory Surdutovich, Ritta Vitlina, and Vitor Baranauskas, "Anisotropic Protective Coating for Brewster angle Windows," Appl. Opt. 38, 4172-4176 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-19-4172


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. M. Saillard and D. Maystre, “Scattering from metallic and dielectric rough surfaces,” J. Opt. Soc. Am. A 7, 982–990 (1990).
  2. J. J. Greffet, “Theoretical model of the shift of the Brewster angle on a rough surface,” Opt. Lett. 17, 238–240 (1992).
  3. A. A. Maradudin, R. E. Luna, and E. R. Méndez, “The Brewster effect for a one-dimensional random surface,” Waves Random Media 3, 51–60 (1993).
  4. G. I. Surdutovich, R. Z. Vitlina, A. V. Ghiner, S. Durrant, and V. Baranauskas, “Three polarization reflectometry methods for determination of the optical anisotropy,” Appl. Opt. 37, 65–78 (1998).
  5. P. Basmaji, V. S. Bagnato, V. Griviskas, G. I. Surdutovich, and R. Z. Vitlina, “Determination of porous silicon film parameters by polarized light reflectance measurement,” Thin Solid Films 233, 131–136 (1993).
  6. R. M. Azzam and N. M. Bashara, “Ellipsometry and polarized light,” (North-Holland, New York, 1977).
  7. K. Robbie and M. F. Brett, “Sculptured thin films and glancing angle deposition: growth mechanics and applications,” J. Vac. Sci. Technol. A 15, 1460–1465 (1997).
  8. I. Hodgkinson, Q. H. Wu, and J. Hazel, “Empirical equations for the principal refractive indices and column angle of obliquely deposited films of tantalum oxide, titanium oxide, and zirconium oxide,” Appl. Opt. 37, 2653–2659 (1998); I. J. Hodgkinson and Q. H. Wu, Birefringent Thin Films and Polarizing Elements (Word Scientific, Singapore, 1997).
  9. S. M. Rytov, “Electromagnetic properties of a finely stratified medium,” Sov. Phys. JETP 2, 466–475 (1956).
  10. B. Djafari Rouhani, and J. Sapriel, “Effective dielectric and photoelastic tensors of superlattices in the long-wavelength regime,” Phys. Rev. B 34, 7114–7120 (1986).
  11. R. Z. Vitlina, “Light reflection from a fine-layer inhomogeneous structure,” Sov. Phys. Opt. Spectrosc. 66, 939–941 (1989).
  12. H. A. Macleod, “Monitoring of optical coatings,” Appl. Opt. 20, 82–89 (1981).
  13. R. Z. Vitlina and A. M. Dykhne, “Reflection of electromagnetic waves from a surface with a low relief,” Sov. Phys. JETP 72, 983–990 (1991).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited