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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 2 — Jan. 10, 1999
  • pp: 409–415

Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy

Lionel Duvillaret, Frédéric Garet, and Jean-Louis Coutaz  »View Author Affiliations


Applied Optics, Vol. 38, Issue 2, pp. 409-415 (1999)
http://dx.doi.org/10.1364/AO.38.000409


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Abstract

Time-domain spectroscopy allows fast and broadband measurement of the optical constants of materials in the terahertz domain. We present a method that improves the determination of the optical constants through simultaneous determination of the sample thickness. This method could be applied to any material with moderate absorption and requires only two measurements of the temporal profile of the terahertz pulses: a reference one without the sample and one transmitted through the sample.

© 1999 Optical Society of America

OCIS Codes
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(300.6270) Spectroscopy : Spectroscopy, far infrared

History
Original Manuscript: July 7, 1998
Revised Manuscript: October 2, 1998
Published: January 10, 1999

Citation
Lionel Duvillaret, Frédéric Garet, and Jean-Louis Coutaz, "Highly precise determination of optical constants and sample thickness in terahertz time-domain spectroscopy," Appl. Opt. 38, 409-415 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-2-409

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