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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 22 — Aug. 1, 1999
  • pp: 4784–4789

Windows in ellipsometry measurements

Gerald E. Jellison, Jr.  »View Author Affiliations


Applied Optics, Vol. 38, Issue 22, pp. 4784-4789 (1999)
http://dx.doi.org/10.1364/AO.38.004784


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Abstract

The effect of windows or lenses placed between the polarization-state generator and the polarization-state detector in a general ellipsometry measurement is examined. It is found that three parameters are required for describing the effects of the window retardation on the ellipsometry measurements. Two of these window parameters can be measured at the same time as the sample parameters if the sample is isotropic, but the third window parameter cannot be determined independently and must be measured separately. If the sample is anisotropic, then none of the windows parameters can be measured independently at the same time as the sample parameters. An example is given in which the strain-induced retardation in fused-silica focusing lenses is measured with a two-modulator generalized ellipsometer and the results are used to correct the sample data.

© 1999 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(260.2130) Physical optics : Ellipsometry and polarimetry
(260.5430) Physical optics : Polarization

History
Original Manuscript: December 14, 1998
Revised Manuscript: April 6, 1999
Published: August 1, 1999

Citation
Gerald E. Jellison, "Windows in ellipsometry measurements," Appl. Opt. 38, 4784-4789 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-22-4784

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