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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 22 — Aug. 1, 1999
  • pp: 4790–4801

Power spectral density analysis of optical substrates for gravitational-wave interferometry

Christopher J. Walsh, Achim J. Leistner, and Bozenko F. Oreb  »View Author Affiliations


Applied Optics, Vol. 38, Issue 22, pp. 4790-4801 (1999)
http://dx.doi.org/10.1364/AO.38.004790


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Abstract

The power spectral density of surface-relief variations on polished optical surfaces across microscopic through to macroscopic spatial scales is calculated from measurements on substrates that are being produced for the Laser Interferometer Gravitational-Wave Observatory (LIGO). These spectra give a guide to the scattering properties of the surface, which in turn critically influence the performance of LIGO. Measurements obtained by use of a full-aperture interferometer and an interference microscope with two different objectives are combined to produce one-dimensional power spectral density representations of the surfaces across spatial frequencies ranging from 0.1 to 8000 cm-1. These measurements from different instruments are in good agreement with an analytic power spectrum that varies as ν-1.5, where ν is the spatial frequency. Some anomalies in the power spectral density spectra can be related to aspects of the polishing process.

© 1999 Optical Society of America

OCIS Codes
(030.5770) Coherence and statistical optics : Roughness
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(220.4840) Optical design and fabrication : Testing
(220.5450) Optical design and fabrication : Polishing
(240.5770) Optics at surfaces : Roughness

History
Original Manuscript: January 4, 1999
Revised Manuscript: April 29, 1999
Published: August 1, 1999

Citation
Christopher J. Walsh, Achim J. Leistner, and Bozenko F. Oreb, "Power spectral density analysis of optical substrates for gravitational-wave interferometry," Appl. Opt. 38, 4790-4801 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-22-4790


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