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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 22 — Aug. 1, 1999
  • pp: 4837–4844

Sensitivity of optical sensors based on laser-excited surface-plasmon waves

Joel Villatoro and Augusto García-Valenzuela  »View Author Affiliations


Applied Optics, Vol. 38, Issue 22, pp. 4837-4844 (1999)
http://dx.doi.org/10.1364/AO.38.004837


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Abstract

We investigate the effect of the divergence of a Gaussian laser beam on the resonance curve and the sensitivity of optical sensors based on surface-plasmon resonance (SPR). For He–Ne laser beams it is found that, for beams with a waist radius of less than 300 µm, the SPR-curve characteristics differ appreciably from the case in which a plane wave is considered. Simple expressions for the sensitivity of (bio)chemical sensors are given. A simple Lorentzian model is used to estimate the maximum possible sensitivity when a multilayer system is used to enhance the resonance peak. It was found that the sensitivity can reach its highest value when the width of the SPR curve is equal to the laser-beam divergence. The results could be particularly important when a SPR curve is used to measure the absolute value of the refractive index of a sample or the dielectric constant and the thickness of a metal layer.

© 1999 Optical Society of America

OCIS Codes
(000.3110) General : Instruments, apparatus, and components common to the sciences
(120.4570) Instrumentation, measurement, and metrology : Optical design of instruments
(120.4640) Instrumentation, measurement, and metrology : Optical instruments
(120.5700) Instrumentation, measurement, and metrology : Reflection
(130.6010) Integrated optics : Sensors
(260.5740) Physical optics : Resonance
(260.6970) Physical optics : Total internal reflection

History
Original Manuscript: February 10, 1999
Revised Manuscript: April 21, 1999
Published: August 1, 1999

Citation
Joel Villatoro and Augusto García-Valenzuela, "Sensitivity of optical sensors based on laser-excited surface-plasmon waves," Appl. Opt. 38, 4837-4844 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-22-4837


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