Metal–dielectric coatings can be used successfully to design broadband absorbers. However, the understanding of the designs is not easy. Here we present a new analytical method using achromatic three-layer stacks. Such metal–dielectric basic structures permit movement from a fixed admittance value to another one over a wide spectral range. Efficient designs are calculated and explained with this method.
© 1999 Optical Society of America
(160.3900) Materials : Metals
(300.1030) Spectroscopy : Absorption
(310.0310) Thin films : Thin films
(310.1210) Thin films : Antireflection coatings
(310.1620) Thin films : Interference coatings
Frédéric Lemarquis and Gérard Marchand, "Analytical Achromatic Design of Metal–Dielectric Absorbers," Appl. Opt. 38, 4876-4884 (1999)