Near Band-Edge Field-Dependent Absorption Coefficient and Refractive Index Determined by Photocurrent and Transmittance Measurements
Applied Optics, Vol. 38, Issue 24, pp. 5127-5132 (1999)
http://dx.doi.org/10.1364/AO.38.005127
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Abstract
A technique is proposed for the extraction of precise values of field-dependent absorption coefficient α and refractive index n from photocurrent and transmittance measurements of optical modulator structures. The technique uses approximate results of α and n extracted from a simplified device as the initial input into an iterative procedure that utilizes the consistency between α and n to obtain successively better estimates of these parameters. The technique was applied to results that were measured experimentally, and we verified the accuracy by using synthetic data. Errors caused by measurement inaccuracy are also investigated. It is shown that the absorption coefficient has a modest sensitivity whereas the refractive index is insensitive to these errors.
© 1999 Optical Society of America
OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(190.5970) Nonlinear optics : Semiconductor nonlinear optics including MQW
(230.2090) Optical devices : Electro-optical devices
(230.4110) Optical devices : Modulators
(230.5590) Optical devices : Quantum-well, -wire and -dot devices
(310.6860) Thin films : Thin films, optical properties
Citation
Ming G. Xu, John M. Dell, John F. Siliquini, and Prashant Chavarkar, "Near Band-Edge Field-Dependent Absorption Coefficient and Refractive Index Determined by Photocurrent and Transmittance Measurements," Appl. Opt. 38, 5127-5132 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-24-5127
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