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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 25 — Sep. 1, 1999
  • pp: 5310–5318

Straightness measurements by use of a reflection confocal optical system

Kiyofumi Matsuda, Maitreyee Roy, John W. O’Byrne, Pal W. Fekete, Tomoaki Eiju, and Colin J. R. Sheppard  »View Author Affiliations


Applied Optics, Vol. 38, Issue 25, pp. 5310-5318 (1999)
http://dx.doi.org/10.1364/AO.38.005310


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Abstract

Straightness measurement is a very important technique in the field of mechanical engineering. A particular application for straightness measurement is high-accuracy machining on a diamond-turning lathe. We propose a novel, to our knowledge, optical method for measuring the straightness of motion, and its mathematical analysis is outlined. The technique is based on measurement of the lateral displacement of point images by use of reflection confocal optical systems. The advantages of this method are that (i) the lateral displacements in the direction of the two axes perpendicular to the optical axis can be measured, (ii) the rotation angles around all three axes can be measured, and (iii) reflection optical systems are more compact in length than are transmission optical systems.

© 1999 Optical Society of America

OCIS Codes
(080.0080) Geometric optics : Geometric optics
(220.1140) Optical design and fabrication : Alignment

History
Original Manuscript: February 22, 1999
Revised Manuscript: May 17, 1999
Published: September 1, 1999

Citation
Kiyofumi Matsuda, Maitreyee Roy, John W. O’Byrne, Pal W. Fekete, Tomoaki Eiju, and Colin J. R. Sheppard, "Straightness measurements by use of a reflection confocal optical system," Appl. Opt. 38, 5310-5318 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-25-5310


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References

  1. Hewlett-Packard, Laser Precision Measurement System 5526A Operating Manual (Hewlett Packard, 3000 Hanover Street, Palo Alto, Calif. 94304-1185, 1976).
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  6. N.a., “A new laser-based straightness measuring system,” Machin. Product. Eng.15July1975, pp. 62–63.
  7. N. Ikawa, S. Shimada, H. Morooka, “Laser beam as a straight datum and its application to straightness measurement at nanometer level,” Ann. CIRP 37, 523–526 (1998). [CrossRef]
  8. M. Yamauchi, K. Matsuda, “Interferometric straightness measurement system using a holographic grating,” Opt. Eng. 33, 1078–1083 (1994). [CrossRef]

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