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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 25 — Sep. 1, 1999
  • pp: 5413–5417

Highly Repetitive, Extreme-Ultraviolet Radiation Source Based on a Gas-Discharge Plasma

Klaus Bergmann, Guido Schriever, Oliver Rosier, Martin Müller, Willi Neff, and Rainer Lebert  »View Author Affiliations


Applied Optics, Vol. 38, Issue 25, pp. 5413-5417 (1999)
http://dx.doi.org/10.1364/AO.38.005413


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Abstract

An extreme-ultraviolet (EUV) radiation source near the 13-nm wavelength generated in a small (1.1 J) pinch plasma is presented. The ignition of the plasma occurs in a pseudosparklike electrode geometry, which allows for omitting a switch between the storage capacity and the electrode system and for low inductive coupling of the electrically stored energy to the plasma. Thus energies of only a few joules are sufficient to create current pulses in the range of several kiloamperes, which lead to a compression and a heating of the plasmas to electron densities of more than 1017 cm−3 and temperatures of several tens of electron volts, which is necessary for emission in the EUV range. As an example, the emission spectrum of an oxygen plasma in the 11–18-nm range is presented. Transitions of beryllium- and lithium-like oxygen ions can be identified. Current waveform and time-resolved measurements of the EUV emission are discussed. In initial experiments a repetitive operation at nearly 0.2 kHz could be demonstrated. Additionally, the broadband emission of a xenon plasma generated in a 2.2-J discharge is presented.

© 1999 Optical Society of America

OCIS Codes
(220.3740) Optical design and fabrication : Lithography
(260.7200) Physical optics : Ultraviolet, extreme
(300.6560) Spectroscopy : Spectroscopy, x-ray
(350.5400) Other areas of optics : Plasmas

Citation
Klaus Bergmann, Guido Schriever, Oliver Rosier, Martin Müller, Willi Neff, and Rainer Lebert, "Highly Repetitive, Extreme-Ultraviolet Radiation Source Based on a Gas-Discharge Plasma," Appl. Opt. 38, 5413-5417 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-25-5413

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