OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 25 — Sep. 1, 1999
  • pp: 5438–5446

Instrument line shape of Fourier transform spectrometers: analytic solutions for nonuniformly illuminated off-axis detectors

Jérôme Genest and Pierre Tremblay  »View Author Affiliations


Applied Optics, Vol. 38, Issue 25, pp. 5438-5446 (1999)
http://dx.doi.org/10.1364/AO.38.005438


View Full Text Article

Enhanced HTML    Acrobat PDF (165 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

A simple and powerful method for obtaining analytic instrument line shapes (ILS’s) for Fourier transform spectrometers is explained. ILS’s for off-axis circular and rectangular detectors are calculated to illustrate the method. Results match earlier ILS simulations. The contribution of the nonuniformity of light intensity across the detector surface is also taken into account.

© 1999 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry

History
Original Manuscript: January 20, 1999
Revised Manuscript: May 27, 1999
Published: September 1, 1999

Citation
Jérôme Genest and Pierre Tremblay, "Instrument line shape of Fourier transform spectrometers: analytic solutions for nonuniformly illuminated off-axis detectors," Appl. Opt. 38, 5438-5446 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-25-5438


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. G. A. Vanasse, H. Sakai, “Fourier spectroscopy,” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1967), Vol. 6, Chap. 7, pp. 259–330. [CrossRef]
  2. E. Niple, A. Pires, K. Poultney, “Exact modeling of line-shape and wave-number variations for off-axis detectors in Fourier transform spectrometer (FTS) sensor systems,” in Technologies of Cryogenically Cooled Sensors and Fourier Transform Spectrometers II, R. J. Huppi, ed., Proc. SPIE364, 11–20 (1982). [CrossRef]
  3. B. K. Yap, W. A. M. Blumberg, R. E. Murphy, “Off-axis effect in a mosaic Michelson interferometer,” Appl. Opt. 21, 4176–4182 (1982). [CrossRef] [PubMed]
  4. J. W. Brault, “Fourier transform spectrometry,” in High Resolution in Astronomy, Proceedings of the 15th Advanced Course of the Swiss Society of Astronomy and Astrophysics, A. O. Benz, M. C. E. Huber, M. Mayor, eds. (Swiss Society of Astronomy and Astrophysics, Saas-Fee, 1985), pp. 1–61.
  5. J. Connes, “Domaine d’utilisation de la Méthode par Transforme de Fourier,” J. Phys. Rad. 19, 197–208 (1958). [CrossRef]
  6. P. R. Griffiths, J. A. de Haseth, Fourier Transform Infrared Spectrometry (Wiley, New York, 1986).
  7. J. Giroux, A. Villemaire, “Off-axis effects in image formation,” in Proceedings of the Fifth International Workshop on Athmospheric Science from Space by Using Fourier Transform Spectroscopy (Japan Resource Observation System Organization, Tokyo, 1994), pp. 331–352.
  8. J. Kauppinen, P. Saarinen, “Line-shape distortions in misaligned cube corner interferometers,” Appl. Opt. 31, 69–74 (1992). [CrossRef] [PubMed]
  9. P. Saarinen, J. Kauppinen, “Spectral line-shape distortions in Michelson interferometers due to off-focus radiation source,” Appl. Opt. 31, 2353–2359 (1992). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited