The intrinsic error propagation in a technique that uses total reflection geometry for the measurement of χ<sup>(3)</sup> is calculated. The results show how accurately the parameters should be measured to obtain the χ<sup>(3)</sup> value with the required precision. The film thickness should be slightly less than the fundamental wavelength to reduce the χ<sup>(3)</sup> error that propagates from other parameters.
© 1999 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6710) Instrumentation, measurement, and metrology : Susceptibility
(190.2620) Nonlinear optics : Harmonic generation and mixing
(190.4400) Nonlinear optics : Nonlinear optics, materials
Masashi Kiguchi, "Calculation of Error Propagation by use of Total Reflection Geometry for Evaluating Third-Order Nonlinear Optical Materials," Appl. Opt. 38, 5795-5798 (1999)