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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 27 — Sep. 20, 1999
  • pp: 5795–5798

Calculation of error propagation by use of total reflection geometry for evaluating third-order nonlinear optical materials

Masashi Kiguchi  »View Author Affiliations


Applied Optics, Vol. 38, Issue 27, pp. 5795-5798 (1999)
http://dx.doi.org/10.1364/AO.38.005795


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Abstract

The intrinsic error propagation in a technique that uses total reflection geometry for the measurement of χ(3) is calculated. The results show how accurately the parameters should be measured to obtain the χ(3) value with the required precision. The film thickness should be slightly less than the fundamental wavelength to reduce the χ(3) error that propagates from other parameters.

© 1999 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.6710) Instrumentation, measurement, and metrology : Susceptibility
(190.2620) Nonlinear optics : Harmonic generation and mixing
(190.4400) Nonlinear optics : Nonlinear optics, materials

History
Original Manuscript: November 9, 1998
Revised Manuscript: July 12, 1999
Published: September 20, 1999

Citation
Masashi Kiguchi, "Calculation of error propagation by use of total reflection geometry for evaluating third-order nonlinear optical materials," Appl. Opt. 38, 5795-5798 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-27-5795

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