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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 28 — Oct. 1, 1999
  • pp: 5944–5947

Transient Deformation Measurement with Electronic Speckle Pattern Interferometry by Use of a Holographic Optical Element for Spatial Phase Stepping

Bernardino Barrientos García, Andrew J. Moore, Carlos Pérez-López, Lingli Wang, and Theo Tschudi  »View Author Affiliations


Applied Optics, Vol. 38, Issue 28, pp. 5944-5947 (1999)
http://dx.doi.org/10.1364/AO.38.005944


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Abstract

We have used a computer-generated holographic optical element (HOE) with electronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase change between the ∓1 diffracted orders, without being translated. The progressive propagation of transient mechanical waves was measured with an rms precision of 2π/30.

© 1999 Optical Society of America

OCIS Codes
(090.2890) Holography : Holographic optical elements
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

Citation
Bernardino Barrientos García, Andrew J. Moore, Carlos Pérez-López, Lingli Wang, and Theo Tschudi, "Transient Deformation Measurement with Electronic Speckle Pattern Interferometry by Use of a Holographic Optical Element for Spatial Phase Stepping," Appl. Opt. 38, 5944-5947 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-28-5944


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References

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