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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 28 — Oct. 1, 1999
  • pp: 5981–5994

Absolute interferometry with a 670-nm external cavity diode laser

Jack A. Stone, Alois Stejskal, and Lowell Howard  »View Author Affiliations


Applied Optics, Vol. 38, Issue 28, pp. 5981-5994 (1999)
http://dx.doi.org/10.1364/AO.38.005981


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Abstract

In the past few years there has been much interest in use of tunable diode lasers for absolute interferometry. Here we report on use of an external cavity diode laser operating in the visible (λ ∼ 670 nm) for absolute distance measurements. Under laboratory conditions we achieve better than 1-µm standard uncertainty in distance measurements over a range of 5 m, but significantly larger uncertainties will probably be more typical of shop-floor measurements where conditions are far from ideal. We analyze the primary sources of uncertainty limiting the performance of wavelength-sweeping methods for absolute interferometry, and we discuss how errors can be minimized. Many errors are greatly magnified when the wavelength sweeping technique is used; sources of error that are normally relevant only at the nanometer level when standard interferometric techniques are used may be significant here for measurements at the micrometer level.

© 1999 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry

History
Original Manuscript: March 29, 1999
Revised Manuscript: June 28, 1999
Published: October 1, 1999

Citation
Jack A. Stone, Alois Stejskal, and Lowell Howard, "Absolute interferometry with a 670-nm external cavity diode laser," Appl. Opt. 38, 5981-5994 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-28-5981


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References

  1. R. J. Tansey, “An absolute distance interferometer using a dye laser heterodyne interferometer and spatial separation of beams,” in Precision Surface Metrology, J. C. Wyant, ed., Proc. SPIE429, 43–54 (1983), and references therein.
  2. J. A. Stone, L. Howard, A. Stejskal, M. Stephens, C. Oates, L. Hollberg, “Novel methods for length measurement employing diode lasers,” in Proceedings of the 1996 NCSL Workshop and Symposium (National Conference of Standards Laboratories, Boulder Colo., 1996), pp. 667–676.
  3. J. A. Stone, A. Stejskal, L. Howard, “Wavelength shift interferometry: using a dither to improve accuracy,” in Proceedings of the Eleventh Annual Meeting of the American Society for Precision Engineering (American Society for Precision Engineering, Raleigh, N.C., 1996), pp. 357–362.
  4. J. Thiel, T. Pfeifer, C. Haas, “Absolute interferometric distance measurement with tunable laser diodes,” in Third International IMEKO Symposium on Laser Metrology for Precision Measurement and Inspection in Industry, VDI Berichte 1118, T. Pfeifer, ed. (VDI-Verlag, Duesseldorf, 1994), pp. 79–84.
  5. J. Thiel, T. Pfeifer, M. Haetmann, “Interferometric measurement of absolute distances of up to 40 m,” Measurement 16, 1–6 (1995). [CrossRef]
  6. D. Xiaoli, S. Katuo, “High-accuracy absolute distance measurement by means of wavelength scanning heterodyne interferometry,” Meas. Sci. Technol. 9, 1031–1035 (1998). [CrossRef]
  7. H. Kikuta, K. Iwata, R. Nagata, “Distance measurement by wavelength shift of laser diode light,” Appl. Opt. 25, 976–980 (1986). [CrossRef]
  8. H. Kikuta, R. Nagata, “Absolute distance measurement by wavelength shift interferometry with a laser diode: some systematic error sources,” Appl. Opt. 26, 1654–1660 (1987). [CrossRef] [PubMed]
  9. G. P. Barwood, P. Gill, W. R. C. Rowley, “High-accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes,” Meas. Sci. Technol. 9, 1036–1041 (1998). [CrossRef]
  10. K.-H. Bechstein, W. Fuchs, “Absolute interferometric distance measurements applying a variable synthetic wavelength,” J. Opt. 29, 179–182 (1998). [CrossRef]
  11. R. R. Baldwin, G. B. Gordon, A. F. Rudé, “Remote laser interferometry,” Hewlett-Packard J. 23, 14–19 (1971).
  12. K. Liu, M. G. Littman, “Novel geometry for single-mode scanning of tunable lasers,” Opt. Lett. 6, 117–118 (1981). [CrossRef] [PubMed]
  13. The laser is New Focus Model 6308. See Ref. 14.
  14. Certain trade names and company products are mentioned in the text or identified in illustrations for adequate specification of the experimental procedure and equipment used. In no case does such identification imply recommendation or endorsement by NIST nor does it imply that the products are necessarily the best available for the purpose.
  15. C.-M. Wu, C.-S. Su, “Nonlinearity in measurements of length by optical interferometry,” Meas. Sci. Technol. 7, 62–68 (1996), and references therein. [CrossRef]
  16. J. Stone, L. Howard, “A simple technique for observing fringe interpolation errors in Michelson interferometers,” Precis. Eng. 22, 220–232 (1998). [CrossRef]
  17. J. Stone, S. D. Phillips, G. A. Mandolfo, “Corrections for wavelength variations in precision interferometric displacement measurements,” J. Res. Natl. Inst. Stand. Technol. 101, 671–674 (1996). [CrossRef]
  18. J. Stone, M. Schroeck, M. Stocker, “Testing displacement measuring interferometer systems,” presented at the 1998 Measurement Science Conference, Pasadena, Calif., 4–6 February 1998.
  19. International Organization for Standardization, “Guide to the expression of uncertainty in measurement” (ISO, Geneva, Switzerland, 1995).
  20. K. P. Birch, M. J. Downs, “Correction to the updated Edlen equation for the refractive index of air,” Metrologia 31, 315–316 (1994). [CrossRef]
  21. The group refractive index ng is related to the phase refractive index np by ng ≈ np – (dnp/dλ0)λ0, where λ0 is the vacuum wavelength. See, for example, J. M. Rüeger, Electronic Distance Measurement (Springer-Verlag, Berlin, 1990), pp. 51–52.
  22. Y. Gürsel, “Metrology for spatial interferometry,” in Amplitude and Intensity Spatial Interferometry II, J. B. Breckinridge, ed., Proc. SPIE2200, 27–34 (1994). [CrossRef]
  23. Association of German Engineers, VDI/VDE Society for Measurement and Control Technology, “Laser interferometry in length measurement,” (VDI-Verlag, Duesseldorf, 1985).

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