The measured optical-constant errors that arise in the Kretschmann configuration from surface roughness have been analyzed. The broadening of the half-width and the change in the reflection minimum of the attenuated-total-reflection curve that are due to the surface roughness are described. Calculation of the correct optical constants and silver-film thickness is demonstrated.
© 1999 Optical Society of America
Original Manuscript: February 9, 1999
Revised Manuscript: June 7, 1999
Published: October 1, 1999
Cheng-Chung Lee and Yi-Jun Jen, "Influence of surface roughness on the calculation of optical constants of a metallic film by attenuated total reflection," Appl. Opt. 38, 6029-6033 (1999)