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Applied Optics

Applied Optics


  • Vol. 38, Iss. 28 — Oct. 1, 1999
  • pp: 6029–6033

Influence of surface roughness on the calculation of optical constants of a metallic film by attenuated total reflection

Cheng-Chung Lee and Yi-Jun Jen  »View Author Affiliations

Applied Optics, Vol. 38, Issue 28, pp. 6029-6033 (1999)

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The measured optical-constant errors that arise in the Kretschmann configuration from surface roughness have been analyzed. The broadening of the half-width and the change in the reflection minimum of the attenuated-total-reflection curve that are due to the surface roughness are described. Calculation of the correct optical constants and silver-film thickness is demonstrated.

© 1999 Optical Society of America

OCIS Codes
(310.0310) Thin films : Thin films
(310.1620) Thin films : Interference coatings
(310.6860) Thin films : Thin films, optical properties

Original Manuscript: February 9, 1999
Revised Manuscript: June 7, 1999
Published: October 1, 1999

Cheng-Chung Lee and Yi-Jun Jen, "Influence of surface roughness on the calculation of optical constants of a metallic film by attenuated total reflection," Appl. Opt. 38, 6029-6033 (1999)

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