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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 28 — Oct. 1, 1999
  • pp: 6034–6035

Dependence of the Reflectance of a Multilayer Reflector on the Thickness of the Outer Layer

Philip Baumeister  »View Author Affiliations


Applied Optics, Vol. 38, Issue 28, pp. 6034-6035 (1999)
http://dx.doi.org/10.1364/AO.38.006034


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Abstract

At nonnormal incidence, the radiant reflectance of a highly reflecting multilayer coating strongly depends on the thickness of the outer layer.

© 1999 Optical Society of America

OCIS Codes
(230.4040) Optical devices : Mirrors
(230.4170) Optical devices : Multilayers
(310.0310) Thin films : Thin films

Citation
Philip Baumeister, "Dependence of the Reflectance of a Multilayer Reflector on the Thickness of the Outer Layer," Appl. Opt. 38, 6034-6035 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-28-6034


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References

  1. J. N. Winn, Y. Fink, S. Fan, and J. D. Joannopoulos, “Omnidirectional reflection from a one dimensional photonic crystal,” Opt. Lett. 23, 1573–1575 (1998).
  2. M. Cutler, “Reflection of light from multilayer films,” B.S. thesis (Department of Physics, Massachusetts Institute of Technology, 13 May 1939).
  3. H. F. Mahlein, “Properties of laser mirrors at nonnormal incidence,” Opt. Acta 20, 687–697 (1973).
  4. K. D. Laakmann and M. B. Levy, “Hollow lightpipe and lightpipe tip using a low refractive index inner layer,” U.S. patent 5,005,944 (9 April 1991).
  5. G. Koppelmann, “Zur Theorie der Wechselschichten aus schwachabsorbierenden Substanzen und ihre Verwendung als Interferometerespiegel,” Ann. Phys. (Leipzig) 5, 388–404 (1960).

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