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Applied Optics

Applied Optics


  • Vol. 38, Iss. 30 — Oct. 20, 1999
  • pp: 6350–6356

Polarization characteristics of Spectralon illuminated by coherent light

David A. Haner, Brendan T. McGuckin, and Carol J. Bruegge  »View Author Affiliations

Applied Optics, Vol. 38, Issue 30, pp. 6350-6356 (1999)

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The Multiangle Imaging Spectroradiometer makes use of an onboard calibration system that includes two Spectralon panels that are used to reflect sunlight into the cameras. During preflight testing, these panels were quantified in terms of their bidirectional reflectance distribution function, which was measured as a function of the source-incident and detector view angles and at laser wavelengths of 442.0, 632.8, and 859.9 nm. Principal plane measurements are presented in which polarizations of the source and detector are analyzed. These data are unique and valuable in modeling Spectralon reflectance properties and for experiments in which polarization sensitivities are important.

© 1999 Optical Society of America

OCIS Codes
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.5700) Instrumentation, measurement, and metrology : Reflection

Original Manuscript: March 19, 1999
Revised Manuscript: July 19, 1999
Published: October 20, 1999

David A. Haner, Brendan T. McGuckin, and Carol J. Bruegge, "Polarization characteristics of Spectralon illuminated by coherent light," Appl. Opt. 38, 6350-6356 (1999)

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  1. C. J. Bruegge, A. E. Stiegman, R. A. Rainen, A. W. Springstein, “Use of Spectralon as a diffuse reflectance standard for in-flight calibration of earth-orbiting sensors,” Opt. Eng. 32, 805–814 (1993). [CrossRef]
  2. C. J. Bruegge, V. G. Duval, N. L. Chrien, D. J. Diner, “Calibration plans for the Multi-angle Imaging SpectroRadiometer (MISR),” Metrologia 30, 213–221 (1993). [CrossRef]
  3. C. J. Bruegge, N. L. Chrien, D. A. Haner, “A Spectralon BRF data base for MISR calibration applications,” Remote Sens. Environ. (to be published).
  4. D. J. Diner, J. C. Beckert, T. H. Reilly, C. J. Bruegge, J. E. Conel, R. Kahn, J. V. Martonchik, T. P. Ackerman, R. Davies, S. A. W. Gerstl, H. R. Gordon, J.-P. Muller, R. Myneni, R. J. Sellers, B. Pinty, M. M. Verstraete, “Multiangle Imaging SpectroRadiometer (MISR) description and experiment overview,” IEEE Trans. Geosci. Remote Sens. 36, 1072–1087 (1998). [CrossRef]
  5. S. P. Flasse, M. M. Verstraete, B. Pinty, C. J. Bruegge, “Modeling Spectralon’s bidirectional reflectance for in-flight calibration of Earth-orbiting sensors,” in Recent Advances in Sensors, Radiometric Calibration, and Processing of Remotely Sensed Data, P. S. Chavez, A. Schowengerdt, eds., Proc. SPIE1938, 100–108 (1993). [CrossRef]
  6. J. A. Walker, “Models and validation measurements of bidirectional reflectance factor for diffuse reflecting materials,” (M.S. thesis, Optical Sciences Center, University of Arizona, Tucson, Ariz., 1998).
  7. F. E. Nicodemus, J. C. Richmmond, J. J. Hsia, I. W. Ginsburg, T. Limperis, “Geometrical considerations and nomenclature for reflectance,” Natl. Bur. Stand. (U.S.) Monogr.160 (U.S. GPO, Washington, D.C., 1977).
  8. W. G. Egan, J. Grusauskas, H. B. Hallock, “Optical depolarization properties of surfaces illuminated by coherent light,” Appl. Opt. 7, 1529–1534 (1968). [CrossRef] [PubMed]
  9. B. T. McGuckin, D. A. Haner, R. T. Menzies, C. Esproles, A. M. Brothers, “Directional reflectance characterization facility and measurement methodology,” Appl. Opt. 35, 4827–4834 (1996). [CrossRef] [PubMed]
  10. D. A. Haner, B. T. McGuckin, R. T. Menzies, C. J. Bruegge, V. Duval, “Directional–hemispherical reflectance for Spectralon by integration of its bidirectional reflectance,” Appl. Opt. 37, 3996–3999 (1998). [CrossRef]
  11. D. A. Haner, R. T. Menzies, “Reflectance characteristics of reflectance materials used in lidar hard target calibration,” Appl. Opt. 28, 857–864 (1989). [CrossRef] [PubMed]
  12. K. E. Torrance, E. M. Sparrow, R. C. Birkebak, “Polarization, directional distribution, and off-specular phenomena in light reflected from roughened surfaces,” J. Opt. Soc. Am. 56, 916–925 (1966). [CrossRef]
  13. K. E. Torrance, “Theoretical polarization of off-specular reflection peaks,” J. Heat Transfer 91, 287–290 (1969). [CrossRef]
  14. D. C. Cramer, M. E. Blair, “Some polarization characteristics of magnesium oxide and other diffuse reflectors,” Appl. Opt. 8, 1597–1605 (1969). [CrossRef]
  15. B. T. McGuckin, D. A. Haner, R. T. Menzies, “Multiangle imaging spectroradiometer: optical characterization of the calibration panels,” Appl. Opt. 36, 7016–7022 (1997). [CrossRef]
  16. G. C. McCoyd, “Polarization properties of a simple dielectric rough surface model,” J. Opt. Soc. Am. 57, 1345–1350 (1967). [CrossRef]
  17. E. A. Early, R. A. Barnes, B. C. Johnson, J. J. Butler, C. J. Bruegge, S. F. Biggar, P. R. Spyak, M. M. Pavlov, “Bi-directional reflectance round robin in support of the Earth Observing System program,” J. Atmos. Oceanic Technol. (to be published).

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