The Multiangle Imaging Spectroradiometer makes use of an onboard calibration system that includes two Spectralon panels that are used to reflect sunlight into the cameras. During preflight testing, these panels were quantified in terms of their bidirectional reflectance distribution function, which was measured as a function of the source-incident and detector view angles and at laser wavelengths of 442.0, 632.8, and 859.9 nm. Principal plane measurements are presented in which polarizations of the source and detector are analyzed. These data are unique and valuable in modeling Spectralon reflectance properties and for experiments in which polarization sensitivities are important.
© 1999 Optical Society of America
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.5700) Instrumentation, measurement, and metrology : Reflection
David A. Haner, Brendan T. McGuckin, and Carol J. Bruegge, "Polarization Characteristics of Spectralon Illuminated by Coherent Light," Appl. Opt. 38, 6350-6356 (1999)