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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 30 — Oct. 20, 1999
  • pp: 6350–6356

Polarization characteristics of Spectralon illuminated by coherent light

David A. Haner, Brendan T. McGuckin, and Carol J. Bruegge  »View Author Affiliations


Applied Optics, Vol. 38, Issue 30, pp. 6350-6356 (1999)
http://dx.doi.org/10.1364/AO.38.006350


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Abstract

The Multiangle Imaging Spectroradiometer makes use of an onboard calibration system that includes two Spectralon panels that are used to reflect sunlight into the cameras. During preflight testing, these panels were quantified in terms of their bidirectional reflectance distribution function, which was measured as a function of the source-incident and detector view angles and at laser wavelengths of 442.0, 632.8, and 859.9 nm. Principal plane measurements are presented in which polarizations of the source and detector are analyzed. These data are unique and valuable in modeling Spectralon reflectance properties and for experiments in which polarization sensitivities are important.

© 1999 Optical Society of America

OCIS Codes
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(120.5410) Instrumentation, measurement, and metrology : Polarimetry
(120.5700) Instrumentation, measurement, and metrology : Reflection

History
Original Manuscript: March 19, 1999
Revised Manuscript: July 19, 1999
Published: October 20, 1999

Citation
David A. Haner, Brendan T. McGuckin, and Carol J. Bruegge, "Polarization characteristics of Spectralon illuminated by coherent light," Appl. Opt. 38, 6350-6356 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-30-6350

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