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Applied Optics

Applied Optics


  • Vol. 38, Iss. 31 — Nov. 1, 1999
  • pp: 6587–6596

Local spectral information in the near field with wavelet analysis and entropy

Dominique Barchiesi and Tijani Gharbi  »View Author Affiliations

Applied Optics, Vol. 38, Issue 31, pp. 6587-6596 (1999)

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In near-field optical microscopy the resolution is strongly related to the experimental illumination conditions and to the separation between tip and sample. Therefore the spectral information in near-field data (related to the resolution in images) can be described only locally as a function of the tip–sample position. To make a local study of the spectral information in near-field data, we use wavelet decomposition that is associated with the calculation of entropy. We deduce the resolution from the characteristics of the wavelet, which leads to an automatic and numerical evaluation of the resolution in near-field data.

© 1999 Optical Society of America

OCIS Codes
(070.4560) Fourier optics and signal processing : Data processing by optical means
(180.5810) Microscopy : Scanning microscopy
(350.5730) Other areas of optics : Resolution

Original Manuscript: March 18, 1999
Revised Manuscript: June 29, 1999
Published: November 1, 1999

Dominique Barchiesi and Tijani Gharbi, "Local spectral information in the near field with wavelet analysis and entropy," Appl. Opt. 38, 6587-6596 (1999)

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