We have constructed a two-dimensional refracted-ray scanner that can resolve index-of-refraction increments of approximately 4 × 10−5. This resolution is an order of magnitude finer than the uncertainty of the measurement. The scanner can be adapted to evaluate either fibers or planar waveguides. The two-dimensional scan and the high precision allow visualization of features, such as deposition layers, that are difficult if not impossible to see in conventional one-dimensional scans.
© 1999 Optical Society of America
(060.0060) Fiber optics and optical communications : Fiber optics and optical communications
(060.2300) Fiber optics and optical communications : Fiber measurements
(060.2430) Fiber optics and optical communications : Fibers, single-mode
(130.0130) Integrated optics : Integrated optics
Norman H. Fontaine and Matt Young, "Two-Dimensional Index Profiling of Fibers and Waveguides," Appl. Opt. 38, 6836-6844 (1999)