High-frequency-stability diode-pumped Nd:YAG lasers with the FM sidebands method and Doppler-free iodine lines at 532 nm
Applied Optics, Vol. 38, Issue 33, pp. 6962-6966 (1999)
http://dx.doi.org/10.1364/AO.38.006962
Acrobat PDF (96 KB)
Abstract
The FM spectroscopy technique has been applied to two frequency-doubled Nd:YAG lasers to achieve absolute frequency stabilization against the hyperfine structure components of the rovibronic P(54) 32–0 iodine line at 532 nm. A fractional frequency stability of 2 × 10−13 τ−1/2 has been obtained for integration times in the range of 1 ms < τ < 10 s. For longer integration times the stability level remains below 10−13, reaching a minimum value of 4.6 × 10−14 at 100 s. This high stability level is, to our knowledge, the best value achieved against iodine lines by this locking method and for a fully transportable system.
© 1999 Optical Society of America
[Optical Society of America ]
OCIS Codes
(020.2930) Atomic and molecular physics : Hyperfine structure
(120.3930) Instrumentation, measurement, and metrology : Metrological instrumentation
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.4800) Instrumentation, measurement, and metrology : Optical standards and testing
(300.6320) Spectroscopy : Spectroscopy, high-resolution
Citation
Gianluca Galzerano, Cesare Svelto, Elio Bava, and Fabrizio Bertinetto, "High-frequency-stability diode-pumped Nd:YAG lasers with the FM sidebands method and Doppler-free iodine lines at 532 nm," Appl. Opt. 38, 6962-6966 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-33-6962
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