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Applied Optics

Applied Optics


  • Vol. 38, Iss. 36 — Dec. 20, 1999
  • pp: 7475–7480

Effect of beam-splitter emission in Fourier-transform emission spectroscopy

Bruno Carli, Luca Palchetti, and Piera Raspollini  »View Author Affiliations

Applied Optics, Vol. 38, Issue 36, pp. 7475-7480 (1999)

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A simple model of an emission Fourier-transform spectrometer is provided for a beam splitter with infinitesimal thickness but with general optical properties otherwise. Using the principle of conservation of energy, we derived the rigorous expressions that relate the interferograms from three different signals (source, reference, and beam-splitter emission), which are simultaneously observed by the detector. The relationship among phase and amplitude of the three interferograms is evaluated. The results indicate that the behavior of a Fourier-transform emission spectrometer may be more complicated than what is assumed in some models. Calibration procedures should reflect the implications of this rigorous approach.

© 1999 Optical Society of America

OCIS Codes
(010.1290) Atmospheric and oceanic optics : Atmospheric optics
(120.0280) Instrumentation, measurement, and metrology : Remote sensing and sensors
(230.1360) Optical devices : Beam splitters
(300.2140) Spectroscopy : Emission
(300.6270) Spectroscopy : Spectroscopy, far infrared
(300.6300) Spectroscopy : Spectroscopy, Fourier transforms

Original Manuscript: May 12, 1999
Revised Manuscript: August 31, 1999
Published: December 20, 1999

Bruno Carli, Luca Palchetti, and Piera Raspollini, "Effect of beam-splitter emission in Fourier-transform emission spectroscopy," Appl. Opt. 38, 7475-7480 (1999)

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