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Applied Optics

Applied Optics


  • Vol. 38, Iss. 4 — Feb. 1, 1999
  • pp: 647–654

Spectroscopic ellipsometry of anisotropic materials: application to the optical constants of HgI2

Aotmane En Naciri, Luc Johann, Roland Kleim, Manuel Sieskind, and Marianne Amann  »View Author Affiliations

Applied Optics, Vol. 38, Issue 4, pp. 647-654 (1999)

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A variable angle-of-incidence spectroscopic fixed-polarizer, rotating-polarizer, fixed-analyzer ellipsometer (PRPSE) across a spectral range from 300 to 800 nm is used to determine the optical properties of anisotropic uniaxial tetragonal red mercuric iodide (HgI2). For the first time, to our knowledge, the bulk crystal HgI2 surface measured by ellipsometry was not subjected to potassium iodide cutting or etching. Measurements were made at an air–HgI2 interface with the optic axis parallel to the sample surface. To determine the optical constants, we varied both the angle of incidence and the azimuth of the optic axis with the plane of incidence. The detailed formulas needed for reliable procedures for analyzing the data are presented. The ordinary and extraordinary complex indices of refraction, (n o - ik o ) and (n e - ik e ), respectively, are determined. Good agreement between PRPSE and the prism technique for the refractive index is observed. The surface aging effects of the ellipsometric parameters of HgI2, during 30 h of exposure to air, were detected by PRPSE.

© 1999 Optical Society of America

OCIS Codes
(120.2130) Instrumentation, measurement, and metrology : Ellipsometry and polarimetry
(240.4350) Optics at surfaces : Nonlinear optics at surfaces
(240.6490) Optics at surfaces : Spectroscopy, surface
(260.1180) Physical optics : Crystal optics

Original Manuscript: July 7, 1998
Revised Manuscript: October 12, 1998
Published: February 1, 1999

Aotmane En Naciri, Luc Johann, Roland Kleim, Manuel Sieskind, and Marianne Amann, "Spectroscopic ellipsometry of anisotropic materials: application to the optical constants of HgI2," Appl. Opt. 38, 647-654 (1999)

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  1. A. C. Boccara, C. Pickering, J. Rivory, Spectroscopic Ellipsometry, Proceedings of the First Conference on Spectroscopic Ellipsometry in Paris (Elsevier, Amsterdam, 1993).
  2. K. Vedam, “Spectroscopic ellipsometry: a historical overview,” Thin Solid Films 313–314, 1–9 (1998). [CrossRef]
  3. X. Wang, J. Yao, “Transmitted and tuning characteristics of birefringent filters,” Appl. Opt. 31, 4505–4508 (1992). [CrossRef] [PubMed]
  4. R. S. Weis, T. K. Gaylord, “Magneto-optic multilayered memory structure with a birefringent superstrate: a rigorous analysis,” Appl. Opt. 28, 1926–1930 (1989). [CrossRef] [PubMed]
  5. A. Michaelis, E. A. Irene, O. Auciello, A. R. Krauss, B. Veal, “A spectroscopic anisotropy ellipsometry study of YBa2Cu3O7–x superconductors,” Thin Solid Films 313–314, 362–367 (1998). [CrossRef]
  6. I. Bozovic, “Plasmons in cuprate superconductors,” Phys. Rev. B 42, 1969–1984 (1990). [CrossRef]
  7. See, for example, G. D. Landry, T. A. Maldonado, “Complete method to determine transmission and reflection characteristics at a planar interface between arbitrarily oriented biaxial media,” J. Opt. Soc. Am. A 12, 2048–2063 (1995) and references therein.
  8. M. Schubert, B. Rheinländer, E. Franke, H. Neumann, J. Hahn, M. Röder, F. Richter, “Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry,” Appl. Phys. Lett. 70, 1819–1821 (1997). [CrossRef]
  9. M. Schubert, “Generalized ellipsometry and complex optical systems,” Thin Solid Films 313–314, 323–332 (1998). [CrossRef]
  10. D. W. Thompson, M. J. DeVries, T. E. Tiwald, J. A. Woollam, “Determination of optical anisotropy in calcite from ultraviolet to mid-infrared by generalized ellipsometry,” Thin Solid Films 313–314, 341–346 (1998); L. A. A. Pettersson, F. Carlsson, O. Inganäs, H. Arwin, “Spectroscopic ellipsometry studies of the optical properties of doped poly(3,4-ethylenedioxythiophene): an anisotropic metal,” Thin Solid Films 313–314, 356–361 (1998). [CrossRef]
  11. D. W. Berreman, “Optics in stratified and anisotropic media: 4 × 4-matrix formulation,” J. Opt. Soc. Am. 62, 502–510 (1971). [CrossRef]
  12. P. Yeh, “Optics of anisotropic layered media: a new 4 × 4 matrix algebra,” Surf. Sci. 96, 41–53 (1980). [CrossRef]
  13. M. Schubert, “Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems,” Phys. Rev. B 53, 4265–4274 (1996). [CrossRef]
  14. E. Franke, M. Schubert, H. Neumann, T. E. Tiwald, D. W. Thompson, J. A. Woollam, J. Hahn, F. Richter, “Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range,” J. Appl. Phys. 82, 2906–2911 (1997). [CrossRef]
  15. M. Elshazly-Zaghloul, R. M. A. Azzam, N. M. Bachara, “Explicit solution for the optical properties of a uniaxial crystal in generalized ellipsometry,” Surf. Sci. 56, 281–292 (1976). [CrossRef]
  16. M. Schubert, B. Rheinländer, J. A. Woollam, B. Johs, C. M. Herzinger, “Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO2,” J. Opt. Soc. Am. A 13, 875–883 (1996). [CrossRef]
  17. R. M. A. Azzam, N. M. Bashara, “Polarization transfer function of a biaxial system as a bilinear transformation,” J. Opt. Soc. Am. 62, 222–229 (1972). [CrossRef]
  18. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977), Chap. 4, p. 355.
  19. R. M. A. Azzam, N. M. Bashara, “Application of generalized ellipsometry to anisotropic crystals,” J. Opt. Soc. Am. 64, 128–133 (1974). [CrossRef]
  20. P. Chindaudom, K. Vedam, “Determination of the optical function n(λ) of vitreous silica by spectroscopic ellipsometry with an achromatic compensator,” Appl. Opt. 32, 6391–6398 (1993). [CrossRef] [PubMed]
  21. See Ref. 16. Also M. I. Alonso, M. Garriga, F. Alsina, S. Pinol, “Determination of the dielectric tensor in anisotropic materials,” Appl. Phys. Lett. 67, 596–598 (1995).
  22. D. J. De Smet, “Ellipsometry of anisotropic substrates: reexamination of a special case,” J. Appl. Phys. 76, 2571–2574 (1994). [CrossRef]
  23. Y. C. Chang, R. B. James, “Electronic and optical properties of HgI2,” Phys. Rev. B 46, 15,040–15,045 (1992). [CrossRef]
  24. J. P. Ponpon, M. Sieskind, “Recent advances in γ- and x-ray spectrometry by means of mercuric iodide detectors,” Nucl. Instrum. Methods A 380, 173–178 (1996). [CrossRef]
  25. S. Bertucci, A. Pawlowski, N. Nicolas, L. Johann, A. El Ghemmaz, N. Stein, R. Kleim, “Systematic errors in fixed polarizer, rotating polarizer, sample, fixed analyzer spectroscopic ellipsometry,” Thin Solid Films 313–314, 73–78 (1998). [CrossRef]
  26. D. E. Aspnes, “Approximate solution of ellipsometric equations for optically biaxial crystals,” J. Opt. Soc. Am. 70, 1275–1277 (1980). [CrossRef] [PubMed]
  27. M. Sieskind, M. Amann, J. P. Ponpon, “Infrared properties of etched mercuric iodide surfaces,” Appl. Phys. A 66, 655–658 (1998). [CrossRef]
  28. J. P. Ponpon, M. Sieskind, M. Amann, A. Benz, C. Corbu, “Characterization of the HgI2 surface layer after KI etching,” Nucl. Instrum. Methods A 380, 112–116 (1996). [CrossRef]
  29. H. Yao, B. Johs, R. B. James, “Optical anisotropic dielectric response of mercuric iodide,” Phys. Rev. B 56, 9414–9421 (1997). [CrossRef]
  30. J. F. McGilp, “Epioptics: linear and nonlinear optical spectroscopy of surfaces and interfaces,” J. Phys. Condensed Matter 3, 7985–8006 (1990). [CrossRef]
  31. J. A. Nelder, R. Mead, “A simplex method for function minimization,” Comput. J. 7, 308–313 (1965). [CrossRef]
  32. M. Sieskind, S. Nikitine, J. B. Grun, “Données nouvelles sur les spectres de réflexion et d’absorption de monocristaux d’iodure mercurique rouge perpendiculaire à l’axe optique,” J. Phys. (Paris) 20, 557–560 (1959).
  33. H. E. Merwin, International Critical Tables (McGraw-Hill, New York, 1930), Vol. 7, p. 21.

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