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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 4 — Feb. 1, 1999
  • pp: 660–665

Interferometric measurement of the modulation transfer function of a spectrometer by using spectral modulations

V. Nirmal Kumar and D. Narayana Rao  »View Author Affiliations


Applied Optics, Vol. 38, Issue 4, pp. 660-665 (1999)
http://dx.doi.org/10.1364/AO.38.000660


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Abstract

We present our results on measurement of the modulation transfer function (MTF) of a given spectrometer by using the sinusoidally modulated spectrum from a Michelson interferometer with white light. We studied the MTF by varying the periodicity of the spectral fringes produced by the interferometer. Experimental data are fitted to a theoretical model to derive the spectral slit width from the measured MTF of the spectrometer.

© 1999 Optical Society of America

OCIS Codes
(070.4790) Fourier optics and signal processing : Spectrum analysis
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(170.4090) Medical optics and biotechnology : Modulation techniques

History
Original Manuscript: July 1, 1998
Revised Manuscript: October 13, 1998
Published: February 1, 1999

Citation
V. Nirmal Kumar and D. Narayana Rao, "Interferometric measurement of the modulation transfer function of a spectrometer by using spectral modulations," Appl. Opt. 38, 660-665 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-4-660

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