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Applied Optics

Applied Optics


  • Vol. 38, Iss. 7 — Mar. 1, 1999
  • pp: 1086–1095

Measurement of axial stress at high spatial resolution in ultraviolet-exposed fibers

Ken W. Raine, Ricardo Feced, Sotoris E. Kanellopoulos, and Vince A. Handerek  »View Author Affiliations

Applied Optics, Vol. 38, Issue 7, pp. 1086-1095 (1999)

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High-spatial-resolution measurements of axial-stress profiles of UV-irradiated fibers are reported, providing diagnostic information and a technique for the direct observation of UV-written grating structures. Measurements have been made with a spatial resolution of ∼0.3 µm, which is capable of resolving detail within the pitch of the gratings.

© 1999 Optical Society of America

OCIS Codes
(060.2300) Fiber optics and optical communications : Fiber measurements
(060.2340) Fiber optics and optical communications : Fiber optics components
(120.5410) Instrumentation, measurement, and metrology : Polarimetry

Original Manuscript: June 23, 1998
Revised Manuscript: October 20, 1998
Published: March 1, 1999

Ken W. Raine, Ricardo Feced, Sotoris E. Kanellopoulos, and Vince A. Handerek, "Measurement of axial stress at high spatial resolution in ultraviolet-exposed fibers," Appl. Opt. 38, 1086-1095 (1999)

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