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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 9 — Mar. 20, 1999
  • pp: 1488–1493

Surface profiling of lithium with a laser-desorption mass-spectrometer microprobe

Grant A. Bickel and Harry M. Adams  »View Author Affiliations


Applied Optics, Vol. 38, Issue 9, pp. 1488-1493 (1999)
http://dx.doi.org/10.1364/AO.38.001488


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Abstract

A laser-desorption mass-spectrometer microprobe has been developed to profile Li distributions on the crevice surfaces of Cr-plated rolled-joint hubs. A single laser pulse is used to desorb and ionize the surface species followed by detection of Li+ in a time-of-flight mass spectrometer. Images of the surface Li distribution are obtained with a resolution of <10 µm. These images are directly compared with Li images from the more conventional secondary ion mass spectrometry technique and evaluated with respect to surface topographical features measured by secondary electron microscopy and atomic force microscopy. The laser-desorption images are shown to provide the same qualitative information as that available from secondary ion mass spectrometry.

© 1999 Optical Society of America

OCIS Codes
(110.0180) Imaging systems : Microscopy
(120.6200) Instrumentation, measurement, and metrology : Spectrometers and spectroscopic instrumentation
(260.5210) Physical optics : Photoionization

History
Original Manuscript: June 22, 1998
Revised Manuscript: September 18, 1998
Published: March 20, 1999

Citation
Grant A. Bickel and Harry M. Adams, "Surface profiling of lithium with a laser-desorption mass-spectrometer microprobe," Appl. Opt. 38, 1488-1493 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-9-1488


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