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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 38, Iss. 9 — Mar. 20, 1999
  • pp: 1792–1797

Characterization of near-field optical probes

Brian Vohnsen and Sergey I. Bozhevolnyi  »View Author Affiliations


Applied Optics, Vol. 38, Issue 9, pp. 1792-1797 (1999)
http://dx.doi.org/10.1364/AO.38.001792


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Abstract

Radiation and collection characteristics of four different near-field optical-fiber probes, namely, three uncoated probes and an aluminum-coated small-aperture probe, are investigated and compared. Their radiation properties are characterized by observation of light-induced topography changes in a photosensitive film illuminated with the probes, and it is confirmed that the radiated optical field is unambiguously confined only for the coated probe. Near-field optical imaging of a standing evanescent-wave pattern is used to compare the detection characteristics of the probes, and it is concluded that, for the imaging of optical-field intensity distributions containing predominantly evanescent-wave components, a sharp uncoated tip is the probe of choice. Complementary results obtained with optical phase-conjugation experiments with the uncoated probes are discussed in relation to the probe characterization.

© 1999 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(180.5810) Microscopy : Scanning microscopy

History
Original Manuscript: April 10, 1998
Revised Manuscript: October 26, 1998
Published: March 20, 1999

Citation
Brian Vohnsen and Sergey I. Bozhevolnyi, "Characterization of near-field optical probes," Appl. Opt. 38, 1792-1797 (1999)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-38-9-1792

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