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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 1 — Jan. 1, 2000
  • pp: 114–117

Heterodyne temporal speckle-pattern interferometry

Pascal Haible, Mahenda P. Kothiyal, and Hans J. Tiziani  »View Author Affiliations


Applied Optics, Vol. 39, Issue 1, pp. 114-117 (2000)
http://dx.doi.org/10.1364/AO.39.000114


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Abstract

In temporal speckle-pattern interferometry deformation information is extracted by a Fourier transform technique from the speckle pattern that is recorded over a period of time as the object is deformed. A limitation of the experimental arrangements reported to date is that the direction of the deformation cannot be determined. We propose removing this limitation by using the heterodyne principle. Some experimental results that were obtained by use of a rotating half-wave-plate frequency shifter are presented.

© 2000 Optical Society of America

OCIS Codes
(040.2840) Detectors : Heterodyne
(120.6160) Instrumentation, measurement, and metrology : Speckle interferometry

History
Original Manuscript: April 7, 1999
Revised Manuscript: July 23, 1999
Published: January 1, 2000

Citation
Pascal Haible, Mahenda P. Kothiyal, and Hans J. Tiziani, "Heterodyne temporal speckle-pattern interferometry," Appl. Opt. 39, 114-117 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-1-114

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