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Applied Optics

Applied Optics


  • Vol. 39, Iss. 1 — Jan. 1, 2000
  • pp: 9–15

Interpolation of the spectral responsivity of silicon photodetectors in the near ultraviolet

Toomas Kübarsepp, Petri Kärhä, and Erkki Ikonen  »View Author Affiliations

Applied Optics, Vol. 39, Issue 1, pp. 9-15 (2000)

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We improve the methods used to interpolate the responsivity of unbiased silicon photodetectors in the near-ultraviolet region. This improvement is achieved by the derivation of an interpolation function for the quantum yield of silicon and by consideration of this function in the interpolation of the internal quantum efficiency of photodiodes. The calculated quantum-yield and spectral-responsivity values are compared with measurement results obtained by the study of a silicon trap detector and with values reported by other research groups. The comparisons show agreement with a standard deviation of 0.4% between our measured and modeled values for both the quantum yield and the spectral responsivity within the wavelength region from 260 to 400 nm. The proposed methods thus extend the predictability of the spectral responsivity of silicon photodetectors to the wavelength region from 260 to 950 nm. Furthermore, an explanation is proposed for the change in the spectral responsivity of silicon photodiodes that is due to UV radiation. In our improved quantum efficiency model the spectral change can be accounted for completely by the adjustment of just one parameter, i.e., the collection efficiency near the SiO2/Si interface.

© 2000 Optical Society of America

OCIS Codes
(040.6040) Detectors : Silicon
(040.7190) Detectors : Ultraviolet
(120.5630) Instrumentation, measurement, and metrology : Radiometry
(230.5160) Optical devices : Photodetectors

Original Manuscript: May 7, 1999
Revised Manuscript: September 14, 1999
Published: January 1, 2000

Toomas Kübarsepp, Petri Kärhä, and Erkki Ikonen, "Interpolation of the spectral responsivity of silicon photodetectors in the near ultraviolet," Appl. Opt. 39, 9-15 (2000)

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