A guided-mode resonant filter with low sideband reflections is proposed. It is shown that, for serious reduction of out-of band reflectance, the combination of waveguide-grating filter design with conventional antireflective stack design methods is not adequate. To achieve symmetrical low sideband reflectances, independent control of various layer thicknesses is necessary. At a given illumination angle with appropriate control of the waveguide thickness, a specific resonant grating filter is designed whose out-of-band reflectance on both sides of the resonant peak is well below 10<sup>−4</sup>. Even 50 nm away from the peak, on both sides, the out-of-band reflectance remains below 10<sup>−3</sup>. Analysis of the variation in the main manufacturing parameters indicates that such filters can be reliably produced with present-day technologies.
© 2000 Optical Society of America
(050.1970) Diffraction and gratings : Diffractive optics
(050.2770) Diffraction and gratings : Gratings
(120.2440) Instrumentation, measurement, and metrology : Filters
(230.7370) Optical devices : Waveguides
(240.0310) Optics at surfaces : Thin films
Zoltan Hegedus and Roger Netterfield, "Low Sideband Guided-Mode Resonant Filter," Appl. Opt. 39, 1469-1473 (2000)