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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 10 — Apr. 1, 2000
  • pp: 1493–1499

Talbot array illuminator for single-shot measurements of laser-induced-damage thresholds of thin-film coatings

Christoph Siegel, Frank Loewenthal, Jürg E. Balmer, and Heinz P. Weber  »View Author Affiliations


Applied Optics, Vol. 39, Issue 10, pp. 1493-1499 (2000)
http://dx.doi.org/10.1364/AO.39.001493


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Abstract

A highly efficient Talbot array illuminator for single-shot, laser-induced-damage test measurements of optical thin-film coatings is proposed. With a periodic binary phase grating, a laser beam is transformed into an ensemble of Gaussian-like spots, which are known as the Fresnel image of the grating. For this purpose hexagonal phase gratings were fabricated and analyzed. With a peak fluence distribution of ∼1 order of magnitude, the damage threshold of thin films can be deduced by use of the data from only a single shot.

© 2000 Optical Society of America

OCIS Codes
(070.6760) Fourier optics and signal processing : Talbot and self-imaging effects
(140.3330) Lasers and laser optics : Laser damage

History
Original Manuscript: July 26, 1999
Revised Manuscript: December 22, 1999
Published: April 1, 2000

Citation
Christoph Siegel, Frank Loewenthal, Jürg E. Balmer, and Heinz P. Weber, "Talbot array illuminator for single-shot measurements of laser-induced-damage thresholds of thin-film coatings," Appl. Opt. 39, 1493-1499 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-10-1493

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