OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 10 — Apr. 1, 2000
  • pp: 1537–1540

Optical properties of hot-pressed B4C in the extreme ultraviolet

Juan I. Larruquert and Ritva A. M. Keski-Kuha  »View Author Affiliations


Applied Optics, Vol. 39, Issue 10, pp. 1537-1540 (2000)
http://dx.doi.org/10.1364/AO.39.001537


View Full Text Article

Enhanced HTML    Acrobat PDF (77 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Hot-pressed B4C is found to have a high normal reflectance in the extreme-UV spectral region above 49 nm. This reflectance is comparable with or higher than chemical-vapor-deposited SiC in the spectral region from 49 to 92 nm. Reflectance measurements as a function of the angle of incidence yielded the optical constants of B4C in the spectral range 49–121.6 nm.

© 2000 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5700) Instrumentation, measurement, and metrology : Reflection
(230.4040) Optical devices : Mirrors
(260.7200) Physical optics : Ultraviolet, extreme
(260.7210) Physical optics : Ultraviolet, vacuum

History
Original Manuscript: October 6, 1999
Revised Manuscript: January 19, 2000
Published: April 1, 2000

Citation
Juan I. Larruquert and Ritva A. M. Keski-Kuha, "Optical properties of hot-pressed B4C in the extreme ultraviolet," Appl. Opt. 39, 1537-1540 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-10-1537


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. W. J. Choyke, R. F. Farich, R. A. Hoffman, “SiC, a new material for mirrors. 1: High power lasers; 2: VUV applications,” Appl. Opt. 15, 2006–2007 (1976), and references therein.
  2. J. B. Kortright, D. L. Windt, “Amorphous silicon carbide coatings for extreme ultraviolet optics,” Appl. Opt. 27, 2841–2846 (1988). [CrossRef] [PubMed]
  3. R. A. M. Keski-Kuha, J. F. Osantowski, H. Herzig, J. S. Gum, A. R. Toft, “Normal incidence reflectance of ion beam deposited SiC films in the EUV,” Appl. Opt. 27, 2815–2816 (1988). [CrossRef] [PubMed]
  4. G. M. Blumenstock, R. A. M. Keski-Kuha, “Ion-beam-deposited boron carbide coatings for extreme ultraviolet,” Appl. Opt. 33, 5962–5963 (1994). [CrossRef] [PubMed]
  5. G. Hass, G. F. Jacobus, “Optical properties of evaporated iridium in the vacuum ultraviolet from 500 Å to 2000 Å,” J. Opt. Soc. Am. 57, 758–762 (1967). [CrossRef]
  6. J. F. Osantowski, “Reflectance and optical constants for Cer-Vit from 250 to 1050 Å,” J. Opt. Soc. Am. 64, 834–838 (1974). [CrossRef]
  7. G. M. Blumenstock, R. A. M. Keski-Kuha, M. L. Ginter, “Extreme ultraviolet optical properties of ion-beam-deposited boron carbide thin films,” in X-Ray and Extreme Ultraviolet Optics, R. B. Hoover, A. B. Walker, eds., Proc. SPIE2515, 558–564 (1995). [CrossRef]
  8. R. A. M. Keski-Kuha, G. M. Blumenstock, C. M. Fleetwood, D. R. Schmitt, “Effects of space exposure on ion-beam-deposited silicon-carbide and boron-carbide coatings,” Appl. Opt. 37, 8038–8042 (1998). [CrossRef]
  9. H. Herzig, A. R. Toft, C. M. Fleetwood, “Long-duration orbital effects on optical coating materials,” Appl. Opt. 32, 1798–1804 (1993). [CrossRef] [PubMed]
  10. J. F. Seely, G. E. Holland, W. R. Hunter, R. P. McCoy, K. F. Dymon, M. Corson, “Effect of oxygen atom bombardment on the reflectance of silicon carbide mirrors in the extreme ultraviolet region,” Appl. Opt. 32, 1805–1810 (1993). [CrossRef] [PubMed]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited