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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 39, Iss. 11 — Apr. 10, 2000
  • pp: 1743–1760

Information metric as a design tool for optoelectronic imaging systems

Rachel Alter-Gartenberg  »View Author Affiliations


Applied Optics, Vol. 39, Issue 11, pp. 1743-1760 (2000)
http://dx.doi.org/10.1364/AO.39.001743


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Abstract

The resolution of images acquired by a digital camera is limited to the camera’s sampling interval. The images’ visual quality is affected by the level of the degradations caused by the imaging process from acquisition to display, including quantization, coding, transmission, and digital filtering. The information metric is presented as a design and an assessment tool for high-resolution digital imaging systems and all their subsystems. It associates gains in the acquired information with improvements in resolution, sharpness, and clarity of the final image representation. It demonstrates the need to integrate a digital filtering module that accounts for the optoelectronic imaging degradations in the optoelectronic imaging design and assessment. It further demonstrates the metric’s sensitivity by the assessment of the combined imaging processes as a unified system.

© 2000 Optical Society of America

OCIS Codes
(100.2000) Image processing : Digital image processing
(100.3020) Image processing : Image reconstruction-restoration
(110.3000) Imaging systems : Image quality assessment
(350.5730) Other areas of optics : Resolution

History
Original Manuscript: June 10, 1999
Revised Manuscript: September 16, 1999
Published: April 10, 2000

Citation
Rachel Alter-Gartenberg, "Information metric as a design tool for optoelectronic imaging systems," Appl. Opt. 39, 1743-1760 (2000)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-39-11-1743

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